Our research uses state-of-the-art facilities covering flexible and printed electronics fabrication, RF characterization and vector network analysis from a few Hz to 67 GHz, and material characterization and microscopy kits.
Electrical Characterization and Electronic Systems Development:
Our facilities, located within the SEMS groups lab, include:
- R&S ZVB4 VNA: two-port calibrated s-parameter measurements from 150 kHz to 4 GHz; time-domain analysis and active devices bias with a variety of measurement cables and fixtures.
- HP (Agilent) 500 MHz VNA: 10 Hz to 500 MHz s-parameters.
- WKL climate chamber for temperature and humidity control
- UHF RFID readers and antennas covering the EU and US frequency bands
- 1 W RF Power Amplifier up to 4 GHz and assorted attenuators and cabling
- 4-channel Tektronix/Agilent oscilloscopes (500 MHz) and logic analyzers
- Voltera dispenser printer for rapid circuits/antennas prototyping
- Various FDM 3D printers
- Zeiss optical microscope
- LoRaWAN TTN outdoor gateway
- A range of commercial and in-house IoT boards based on ST-Microelectronics (STM32), Texas Instruments (MSP430/Arm SimpleLink), Arduino, and others.
In addition to the SEMS electrical and electronics labs, we make regular use of shared core facilities across ECS and FEPS including:
- Agilent PNA (10 MHz to 67 GHz) for calibrated two-port s-parameter measurements of connectorized (1.85 mm to 2.92 mm and SMA) and on-wafer devices
- Printed electronics laboratory, including extensive screen and inkjet printing facilities
- The Zepler Nanofabrication centre
- Material characterization, SEM, and optical surface profiling kits
Our design, fabrication and measurement expertise include:
- Multi-layered flexible circuits fabrication based on copper laminated and screen-printed low-temperature silver inks.
- RF devices, antennas, and material characterization up to 50 GHz.
- Multi-source energy harvesting and low-power sensor nodes
- Extensive mechanical reliability testing of flexible and wearable circuits